A method to detect retained gas during AC electrograining using in-situ small angle X-ray scattering

Electrochemistry Communications

Volumn 12, Issue 6, 2010, Pages 717-719

  Hammons, J A ^a   Rayment, T ^a,b   Vandendael, I ^c   Blajiev, O ^c   Hubin, A ^c   Davenport, A J ^a   Raes, M ^c   Terryn, H ^c  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^c VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

AC processes; Electrograining; Gas retention; Gel; Pitting; SAXS

Indexed keywords

AC PROCESSES; ALUMINIUM PLATES; ANODISING; ELECTROCHEMICAL PROCESS; ELECTROGRAINING; FIELD ION MICROSCOPY; GAS FRACTION; GAS RETENTION; HIGH QUALITY; HYDROGEN GAS; IN-SITU; IONIC TRANSPORTS; LITHOGRAPHIC PRINTING; SAXS; SMALL ANGLE X-RAY SCATTERING; SUPER CAPACITOR; SURFACE FILMS; SURFACE LAYERS; SURFACE-ROUGHENING; TOTAL SCATTERING; WORLDWIDE PRODUCTION;

ALUMINUM; GELS; PITTING; SCATTERING; X RAY SCATTERING;

GASES;

EID: 77955711543     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2010.03.013     Document Type: Article

References (19)

1. G.E. Thompson, and G.C. Wood Corros. Sci. 18 1978
2. H. Terryn, J. Vereecken, and G.E. Thompson Corros. Sci. 32 1991
3. T. Dimogerontakis, and H. Terryn Corros. Sci. 49 2007
4. F. Tomasoni, H. van Parys, H. Terryn, A. Hubin, J. Deconinck, J.M. Buchlin, and J. van Beeck Electrochem. Commun. 12 2010
5. I. De Graeve, H. Terryn, and G.E. Thompson Electrochim. Acta 52 2006
6. M. Fotino Rev. Sci. Instrum. 64 1993
7. M.P. Amor, and J. Ball Corros. Sci. 40 1998
8. C.S. Lin, C.C. Chang, and H.M. Fu Mater. Chem. Phys. 68 2001
9. C.S. Lin, and S.M. Fu J. Electrochem. Soc. 148 2001
10. C.S. Lin, and C.C. Chiu J. Electrochem. Soc. 152 2005
11. B.P. Wilson, A. Dotremont, M. Biesemans, R. Willem, P. Campestrini, and H. Terryn J. Electrochem. Soc. 155 2008
12. J.Y. Bottero, D. Tchoubar, J.M. Cases, and F. Flessinger J. Phys. Chem. 86 1982
13. H.D. Bale, and P.W. Schmidt J. Phys. Chem. 62 1958
14. H.D. Bale, and P.W. Schmidt J. Chem. Phys. 31 1959
15. O. Glatter, and O. Kratky Small Angle X-Ray Scattering 1982 Academic Press, New York New York, U.S.A
16. W. Bras, I.P. Dolbnya, D. Detollenaere, R. van Tol, M. Malfois, G.N. Greaves, A.J. Ryan, and E. Heeley Recent experiments on a combined small-angle/wide-angle X-ray scattering beam line at the ESRF 12th International Conference on Small-Angle Scattering, Venice, Italy 2002 791 794
17. J. Ilavsky, P.R. Jemian, A.J. Allen, F. Zhang, L.E. Levine, and G.G. Long J. Appl. Crystallogr. 42 2009
18. E. Homan, M. Konijnenburg, C. Ferrero, R.E. Ghosh, I.P. Dolbnya, and W. Bras J. Appl. Crystallogr. 34 2001
19. J. Ilavsky, and P.R. Jemian J. Appl. Crystallogr. 42 2009