Compact Gaussian beam system for S-parameter characterization of planar sructures at millimeter-wave frequencies

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 9, 2010, Pages 2437-2444

  Iyer, Shreyas ^a   Cheng, Chih Chieh ^b   Kim, Chong ^b   Abbas, Abbaspour Tamijani ^b  

^a HONEYWELL   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Focusing arrays; frequency selective surfaces (FSSs); Gaussian beams; millimeter wave measurements; quasi optics

Indexed keywords

ANTENNA ELEMENT; ARRAY ANTENNAS; COAXIAL PORTS; CORE COMPONENTS; DEVICE UNDER TEST; FREQUENCY-SELECTIVE SURFACES; INPUT AND OUTPUTS; MEASUREMENT SETUP; MILLIMETER WAVE FREQUENCIES; MILLIMETER WAVE MEASUREMENTS; NETWORK ANALYZER; PORT MEASUREMENTS; QUASI OPTICS; QUASI-OPTICAL; S -PARAMETERS; S-PARAMETER CHARACTERIZATION; TOTAL LENGTH; WIDE-BAND;

ANTENNAS; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC WAVE ABSORPTION; FOCUSING; FREQUENCY RESPONSE; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); MILLIMETER WAVE DEVICES; MILLIMETER WAVES; SCATTERING PARAMETERS; SURFACES;

GAUSSIAN BEAMS;

EID: 77955708991     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2036478     Document Type: Article

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