XPS analysis for degraded Y 2 SiO 5 :Ce phosphor thin films

Applied Surface Science

Volumn 256, Issue 22, 2010, Pages 6641-6648

  Coetsee, E ^a   Terblans, J J ^a   Swart, H C ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

Author keywords

CL; Electron degradation; XPS

Indexed keywords

CERIUM; CHEMICAL ANALYSIS; CHLORINE; ELECTRONS; EMISSION SPECTROSCOPY; LUMINESCENCE; PHOSPHORS; PHOTODEGRADATION; PULSED LASER DEPOSITION; SILICA; SURFACE REACTIONS; THIN FILMS;

BROADBAND EMISSION; COORDINATION NUMBER; ELECTRON BOMBARDMENTS; ELECTRON DEGRADATION; ELECTRON STIMULATED SURFACE CHEMICAL REACTIONS; LUMINESCENT MECHANISM; PHOSPHOR THIN FILMS; THIN FILM ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77955653201     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.04.063     Document Type: Article

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