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Volumn 101, Issue 8, 2010, Pages 951-962

Finite element modelling of coverage effects during shot peening of IN718

Author keywords

Coverage; FEM; Residual stresses; Shot peening; Simulation

Indexed keywords

ARBITRARY VALUES; CONFOCAL WHITE LIGHT MICROSCOPY; COVERAGE; FEM; FINITE ELEMENT MODELLING; MODEL VERIFICATION; NEW APPROACHES; NUMBER OF SHOTS; PROCESS PARAMETERS; RESIDUAL STRESS STATE; SIMULATION; SIMULATION MODEL; STOCHASTIC APPROACH; TEST MATERIALS; TEST SPECIMENS;

EID: 77955640575     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.110375     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.