On effective use of reliability models and defect data in software development

2006 IEEE Region 5 Conference

Volumn , Issue , 2006, Pages 67-71

  Hewett, Rattikorn ^a   Kulkarni, Aniruddha ^a   Seker, Remzi ^b   Stringfellow, Catherine ^c  

^a TEXAS TECH UNIVERSITY   (United States)

^b University of Arkansas   (United States)

^c MIDWESTERN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; LARGE DATASET; OPEN SOURCE SOFTWARE; OPEN SYSTEMS; SALES; SOFTWARE RELIABILITY; SOFTWARE TESTING; STATISTICAL TESTS;

CUSTOMER TESTING; DEVELOPMENT METHODOLOGY; EMPIRICAL STUDIES; EXTREME PROGRAMMING; OPEN SOURCE DEVELOPMENT; RELIABILITY MODEL; SOFTWARE RELEASE; SOFTWARE TECHNOLOGY;

SOFTWARE DESIGN;

EID: 77955637268     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TPSD.2006.5507460     Document Type: Conference Paper

References (10)

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