AI and global science and technology assessment

IEEE Intelligent Systems

Volumn 24, Issue 4, 2009, Pages 68-71

  Chen, Hsinchun ^a,b  

^a UNIVERSITY OF ARIZONA   (United States)

^b Uim Labs   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFORMATION SYSTEMS; KNOWLEDGE MANAGEMENT; OPEN DATA; PRODUCTIVITY; TEXT PROCESSING;

ASSESSMENT METRICS; DIGITAL LIBRARY COLLECTIONS; ENGINEERING SCIENCE; INFORMATION VISUALIZATION; KNOWLEDGE MAPPING; RESEARCH FRAMEWORKS; RESEARCH PRODUCTIVITY; TEXT CATEGORIZATION;

DIGITAL LIBRARIES;

EID: 77955623466     PISSN: 15411672     EISSN: None     Source Type: Journal    
DOI: 10.1109/mis.2009.68     Document Type: Article

References (2)

1. H. Chen and M. Roco, Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis, Springer, 2009.
2. Li et al., "A Longitudinal Analysis of Nanotechnology Literature: 1976-2004," J. Nanoparticle Research, vol.10, suppl. 1, Dec. 2008, pp. 3-22.