Synthesis, deposition and characterization of tin selenide thin films by thermal evaporation technique

Current Applied Physics

Volumn 10, Issue 6, 2010, Pages 1402-1406

  Indirajith, R ^a   Srinivasan, T P ^a   Ramamurthi, K ^b   Gopalakrishnan, R ^a  

^a ANNA UNIVERSITY   (India)

^b BHARATHIDASAN UNIVERSITY   (India)

Author keywords

Nano structures; Optical band gap; Thermal evaporation; Thin films; Tin selenide

Indexed keywords

ALKALINE MEDIUM; AS-DEPOSITED FILMS; ELECTRICAL PROPERTY; GLASS SUBSTRATES; HALL EFFECT MEASUREMENT; NANO-METER SCALE; POWDER X RAY DIFFRACTION; ROOM TEMPERATURE; SOURCE MATERIAL; THERMAL EVAPORATION TECHNIQUE; TIN SELENIDES; UV-VIS-NIR;

DEPOSITION; ELECTRIC PROPERTIES; ENERGY GAP; HALL EFFECT; MAGNETIC FIELD EFFECTS; NANOSTRUCTURES; OPTICAL BAND GAPS; OPTICAL PROPERTIES; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; SUBSTRATES; SYNTHESIS (CHEMICAL); THIN FILMS; TIN; TITANIUM COMPOUNDS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

THERMAL EVAPORATION;

EID: 77955561014     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2010.05.002     Document Type: Article

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