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Volumn 8, Issue 4, 2010, Pages
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Scientific Opinion on Analytical sensitivity of approved TSE rapid tests – new data for assessment of two rapid tests
[No Author Info available]
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Author keywords
analytical sensitivity; BSE; TSE rapid tests
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Indexed keywords
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EID: 77955537268
PISSN: None
EISSN: 18314732
Source Type: Journal
DOI: 10.2903/j.efsa.2010.1591 Document Type: Article |
Times cited : (3)
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References (3)
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