Measurement of electric field distribution using a conventional transmission electron microscope

Journal of Electron Microscopy

Volumn 59, Issue SUPPL. 1, 2010, Pages

  Sasaki, Katsuhiro ^a   Mori, Hiroto ^a   Tanaka, Nobuyuki ^a   Murata, Hidekazu ^b   Morita, Chiaki ^a   Shimoyama, Hiroshi ^b   Kuroda, Kotaro ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b MEIJO UNIVERSITY   (Japan)

Author keywords

field emitter; geometrical electron optics; in situ observation; Kamino holder; shadow method; surface charge method

Indexed keywords

FIELD EMISSION;

ELECTRIC FIELD DISTRIBUTIONS; FIELD EMITTER; GEOMETRICAL ELECTRON OPTIC; IN-SITU OBSERVATIONS; KAMINO HOLDER; MEASUREMENTS OF; SHADOW METHOD; SIMPLE++; SURFACE CHARGE METHOD; TRANSMISSION ELECTRON;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955531294     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq034     Document Type: Conference Paper

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