Computed tomography for application in manufacturing metrology

Key Engineering Materials

Volumn 437, Issue , 2010, Pages 73-78

  Weckenmann, Albert ^a   Krämer, Philipp ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Coordinate metrology; Manufacturing metrology; X ray computed tomography

Indexed keywords

COMPUTERIZED TOMOGRAPHY; MANUFACTURE; OPTICAL DATA PROCESSING;

COORDINATE METROLOGY; MANUFACTURING METROLOGIES; OPTICAL MEASUREMENT; POINT DENSITY; VOLUMETRIC MODELING; X-RAY COMPUTED TOMOGRAPHY;

X RAYS;

EID: 77955522063     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.437.73     Document Type: Conference Paper

References (4)

1. th International Symposium on Measurement and Quality Control (ISMQC), Chennai, India (2007), pp. 1-8.
2. J. Ambrose and G. Hounsfield: Computerized transverse axial tomography, in: British Journal of Radiolog., 46 (542) (1973), pp. 148-149.
3. L.A. Feldkamp, L.C. Davis and J.W. Kress: Practical cone-beam algorithm, in: Journal of the Optical Society of America A, 1 (6) (1984), pp. 612-619.
4. R. Christoph and W. Rauh: Measuring Precisely and Traceably Using X-Ray Computed Tomography, in: Proceedings of the XII. International Colloquium on Surfaces, Chemnitz, Germany (2008), pp. 346-354.