In situ analyses of gallstone inner layers by external PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 17-18, 2010, Pages 2773-2776

  Rautray, Tapash R ^a,b,c   Dutta, Koushik ^b   Das, Saubhagya L ^b   Rautray, Alekh C ^c  

^a Kyungpook National University   (South Korea)

^b INSTITUTE OF PHYSICS   (India)

^c ARASMIN   (India)

Author keywords

External PIXE; Mixed gallstone; Stone layer; Trace element

Indexed keywords

ELEMENTAL PROFILE; EXTERNAL PIXE; IN-SITU ANALYSIS; INNER LAYER; PROTON INDUCED X-RAY EMISSIONS; TRACE LEVEL;

CALCIUM; MANGANESE; MANGANESE COMPOUNDS; RUBIDIUM; STRONTIUM; ZINC;

TRACE ELEMENTS;

EID: 77955517852     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.06.008     Document Type: Article

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