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Volumn 7, Issue 6, 2010, Pages 1602-1604

Seebeck effect of as-grown and micro-structured metallic (Zn,Al)O

Author keywords

Electronic structure; Lithography; Seebeck effect; ZnAlO

Indexed keywords

AS-GROWN; DENSITY OF STATE; FERMI ENERGY; FREE CARRIER CONCENTRATION; METALLIC MATERIAL; MICRO HOLES; PHONON DRAG; SEMICONDUCTOR BEHAVIOR; SIGN REVERSAL; SQUARE GRID; SQUARE-ROOT; SURFACE TRAP; TEMPERATURE DEPENDENCE; UNIT CELLS; WET-CHEMICAL ETCHING;

EID: 77955464445     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200983169     Document Type: Conference Paper
Times cited : (9)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.