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Volumn 7, Issue 6, 2010, Pages 1602-1604
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Seebeck effect of as-grown and micro-structured metallic (Zn,Al)O
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Author keywords
Electronic structure; Lithography; Seebeck effect; ZnAlO
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Indexed keywords
AS-GROWN;
DENSITY OF STATE;
FERMI ENERGY;
FREE CARRIER CONCENTRATION;
METALLIC MATERIAL;
MICRO HOLES;
PHONON DRAG;
SEMICONDUCTOR BEHAVIOR;
SIGN REVERSAL;
SQUARE GRID;
SQUARE-ROOT;
SURFACE TRAP;
TEMPERATURE DEPENDENCE;
UNIT CELLS;
WET-CHEMICAL ETCHING;
ALUMINUM;
BIOACTIVITY;
CARRIER CONCENTRATION;
ELECTRONIC PROPERTIES;
ELECTRONIC STRUCTURE;
PHOTOLITHOGRAPHY;
SEEBECK EFFECT;
ZINC;
SEEBECK COEFFICIENT;
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EID: 77955464445
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200983169 Document Type: Conference Paper |
Times cited : (9)
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References (10)
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