New dinuclear nickel(ii) and iron(ii) complexes with a macrocyclic ligand containing a N6S2 donor-set: Synthesis, structural, MALDI-TOF-MS, magnetic and spectroscopic studies

Dalton Transactions

Volumn 39, Issue 33, 2010, Pages 7673-7683

  Núñez, Cristina ^a   Bastida, Rufina ^a   MacÍas, Alejandro ^a   Valencia, Laura ^b   Ribas, Joan ^c   Capelo, José Luis ^b,d   Lodeiro, Carlos ^b,d  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

^b UNIVERSITY OF VIGO   (Spain)

^c UNIVERSITY OF BARCELONA   (Spain)

^d UNIVERSIDADE NOVA DE LISBOA   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING MODES; CHLORIDE IONS; COORDINATION SPHERE; DINUCLEAR; DIRECT REACTIONS; ELEMENTAL ANALYSIS; FE COMPLEXES; FERROMAGNETIC BEHAVIOUR; FERROMAGNETIC EXCHANGE; IRON COMPLEX; MACRO-CYCLIC LIGANDS; MACROCYCLIC CAVITIES; MACROCYCLICS; MAGNETIC BEHAVIOUR; MAGNETIC SUSCEPTIBILITY MEASUREMENTS; MALDI TOF MS; NICKEL COMPLEX; OCTAHEDRAL GEOMETRY; PYRIDINIC NITROGEN; SECONDARY AMINES; SPECTROSCOPIC STUDIES; SULFUR ATOMS; UV-VIS SPECTROSCOPY; WATER MOLECULE;

CHLORINE COMPOUNDS; COMPUTATIONAL GEOMETRY; DYES; FERROMAGNETIC MATERIALS; FERROMAGNETISM; INDUCTIVELY COUPLED PLASMA; INFRARED SPECTROSCOPY; IRON COMPOUNDS; LIGANDS; MAGNETIC SUSCEPTIBILITY; METAL IONS; MOLECULES; NICKEL ALLOYS; NICKEL COMPOUNDS; ORGANIC COMPOUNDS; SPECTROSCOPIC ANALYSIS; SULFUR; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ATOMS;

AMINE; FERROUS ION; IRON; LIGAND; METAL; NICKEL; ORGANOMETALLIC COMPOUND; PYRIDINE DERIVATIVE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; INFRARED SPECTROPHOTOMETRY; MAGNETISM; MASS SPECTROMETRY; PHYSICAL CHEMISTRY; SPECTROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

AMINES; CRYSTALLOGRAPHY, X-RAY; FERROUS COMPOUNDS; IRON; LIGANDS; MAGNETICS; METALS; MODELS, MOLECULAR; MOLECULAR STRUCTURE; NICKEL; ORGANOMETALLIC COMPOUNDS; PHYSICOCHEMICAL PHENOMENA; PYRIDINES; SPECTROMETRY, MASS, MATRIX-ASSISTED LASER DESORPTION-IONIZATION; SPECTROPHOTOMETRY, INFRARED; SPECTRUM ANALYSIS; X-RAY DIFFRACTION;

EID: 77955453523     PISSN: 14779226     EISSN: 14779234     Source Type: Journal    
DOI: 10.1039/c0dt00182a     Document Type: Article

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