Type-II critical values for a steady-state identifier

Journal of Process Control

Volumn 20, Issue 7, 2010, Pages 885-890

  Shrowti, Neha A ^a   Vilankar, Kedarnath P ^a   Rhinehart, R Russell ^a  

^a Oklahoma State University   (United States)

Author keywords

Critical values; Steady state identification; Type II error

Indexed keywords

CRITICAL VALUE; DATA SEGMENT; IN-PROCESS; MODEL ADAPTATION; NOISE DISTRIBUTION; NULL HYPOTHESIS; PROCESS CONDITION; SIGNAL TO NOISE; STATE IDENTIFICATION; STEADY AND TRANSIENT STATE; STEADY-STATE BEHAVIORS; STEADY-STATE CONDITION; STEADY-STATE IDENTIFICATION; TRANSIENT STATE;

EID: 77955428688     PISSN: 09591524     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jprocont.2010.05.010     Document Type: Article

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