Synthesis, crystal structure and photoluminescence of Eu-α-SiAlON

Journal of Alloys and Compounds

Volumn 504, Issue 2, 2010, Pages 579-584

  Shioi, Kousuke ^a   Hirosaki, Naoto ^b   Xie, Rong Jun ^b   Takeda, Takashi ^b   Li, Yuan Qiang ^b  

^a High Performance Materials Department   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Luminescence; Nitride; SiAlON; Structure; Synthesis

Indexed keywords

ALN; BROAD EMISSION BANDS; DIVALENT STATE; EMISSION INTENSITY; EXCITATION BANDS; N VALUE; NITROGEN ATMOSPHERES; NOMINAL COMPOSITION; OXIDATION STATE; POWDER MIXTURES; SIALON; STRUCTURE SYNTHESIS; TRIVALENT STATE; VISIBLE LIGHT REGION; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION NEAR EDGE SPECTRUMS; X-RAY POWDER DIFFRACTION PATTERN;

ABSORPTION; ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; HOLOGRAPHIC INTERFEROMETRY; LATTICE CONSTANTS; LUMINESCENCE; NITRIDES; RIETVELD ANALYSIS; RIETVELD METHOD; SILICON; X RAY ABSORPTION; X RAY POWDER DIFFRACTION; X RAYS;

EUROPIUM;

EID: 77955420164     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.05.164     Document Type: Article

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