Performance analysis of field exposed single crystalline silicon modules

Solar Energy Materials and Solar Cells

Volumn 94, Issue 9, 2010, Pages 1463-1468

  Sastry, O S ^a   Saurabh, Sriparn ^a   Shil, S K ^a   Pant, P C ^a   Kumar, Rajesh ^a   Kumar, Arun ^a   Bandopadhyay, Bibek ^a  

^a Ministry of Energy   (India)

Author keywords

Cell de lamination; Corrosion of metallic contacts; EVA browning; Field exposure; Silicon module test bed; Terminal box failures

Indexed keywords

CRYSTALLINE SILICON PV MODULES; DATA LOGGER; FIELD CONDITIONS; FIELD EXPOSURE; FIELD PERFORMANCE; FILL FACTOR; FUNCTION OF TIME; I - V CURVE; MANUAL TRACKING; METALLIC CONTACTS; PERFORMANCE ANALYSIS; PERFORMANCE PARAMETERS; PV MODULES; QUALIFICATION STANDARDS; QUALITATIVE STUDY; SILICON MODULES; SINGLE CRYSTALLINE SILICON; SUN SIMULATOR; TERMINAL BOX FAILURES;

CRYSTALLINE MATERIALS; EQUIPMENT TESTING; LAMINATING; PHOTOVOLTAIC EFFECTS; TEST FACILITIES;

CORROSION;

EID: 77955414346     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.03.035     Document Type: Conference Paper

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