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Volumn 219, Issue 1 PART 3, 2010, Pages

Application of the Kalman Alignment Algorithm to the CMS tracker

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; SILICON DETECTORS; SYSTEMATIC ERRORS;

EID: 77955343256     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/219/3/032065     Document Type: Conference Paper
Times cited : (4)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.