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Volumn , Issue , 2010, Pages

Validation of ridge gap waveguide performance using in-house TRL calibration Kit

Author keywords

[No Author keywords available]

Indexed keywords

LOW LOSS; MANUFACTURING TOLERANCES; MEASUREMENT UNCERTAINTY; S-PARAMETERS; TRL CALIBRATION; WAVEGUIDE TECHNOLOGY; WIDE BANDWIDTH;

EID: 77955328320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (26)

References (10)
  • 3
    • 70349876679 scopus 로고    scopus 로고
    • Three metamaterial-based gap-waveguides between parallel metal plates for mm/submm waves
    • Berlin, March
    • P.-S. Kildal, "Three metamaterial - based gap-waveguides between parallel metal plates for mm/submm waves," 3rd European Conference on Antennas and Propagation, Berlin, March 2009.
    • (2009) 3rd European Conference on Antennas and Propagation
    • Kildal, P.-S.1
  • 4
    • 75149159965 scopus 로고    scopus 로고
    • Parallel plate cavity mode suppression in microstrip circuit packages using a lid of nails
    • Dec.
    • E. Rajo-Iglesias, A. Uz Zaman, P.-S. Kildal, "Parallel plate cavity mode suppression in microstrip circuit packages using a lid of nails", IEEE Microwave and Wireless Components Letters, Vol. 20, No. 1, pp. 31-33, Dec. 2009.
    • (2009) IEEE Microwave and Wireless Components Letters , vol.20 , Issue.1 , pp. 31-33
    • Rajo-Iglesias, E.1    Zaman, A.U.2    Kildal, P.-S.3
  • 5
    • 13244272053 scopus 로고    scopus 로고
    • Miniaturized rectangular hard waveguides for use in multi-frequency phased arrays
    • Jan.
    • M. Ng Mou Kehn and P.-S. Kildal, "Miniaturized rectangular hard waveguides for use in multi-frequency phased arrays", IEEE Transactions on Antennas and Propagation, vol. 53, no. 1, pp. 100-109, Jan 2005.
    • (2005) IEEE Transactions on Antennas and Propagation , vol.53 , Issue.1 , pp. 100-109
    • Kehn, M.N.M.1    Kildal, P.-S.2
  • 8
    • 0018720739 scopus 로고
    • Thru-Reflect-Line: An improved technique for calibrating the dual six port automatic network analyzer
    • December
    • Glenn F. Engen, Cletus A. Hoer, "Thru-Reflect-Line: An improved technique for calibrating the dual six port automatic network analyzer", IEEE Transactions on MTT, vol.27, no.12, pp. 987-993, December 1979.
    • (1979) IEEE Transactions on MTT , vol.27 , Issue.12 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2
  • 9
    • 0024765129 scopus 로고
    • Improved Calibration and Measurement of the Scattering parameters of microwave integrated circuits
    • November
    • Renato R. Pantoja, Michel J. Howes, John R. Richardson, Roger D. Pollard, "Improved Calibration and Measurement of the Scattering parameters of microwave integrated circuits", IEEE Transactions on MTT, vol.37, no.11, pp. 1675-1680, November 1989.
    • (1989) IEEE Transactions on MTT , vol.37 , Issue.11 , pp. 1675-1680
    • Pantoja, R.R.1    Howes, M.J.2    Richardson, J.R.3    Pollard, R.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.