Rubrene microcrystals: A route to investigate surface morphology and bulk anisotropies of organic semiconductors

Crystal Growth and Design

Volumn 10, Issue 8, 2010, Pages 3496-3501

  El Helou, Mira ^a   Medenbach, Olaf ^b   Witte, Gregor ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; BULK MEASUREMENT; CRYSTAL HABITS; LASER DESORPTION IONIZATION; LOW DENSITY; LOW-INDEX SURFACES; ORGANIC SEMICONDUCTOR; RUBRENES; SURFACE STUDY; THERMAL EQUILIBRIUM CONDITION; TIME-OF-FLIGHT MASS SPECTROSCOPY; ULTRAFLAT;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CRYSTAL ORIENTATION; CRYSTALLITES; DESORPTION; MASS SPECTROMETRY; MICROCRYSTALS; REFRACTIVE INDEX;

SINGLE CRYSTALS;

EID: 77955311877     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg1003758     Document Type: Article

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