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Applied Surface Science

Volumn 256, Issue 23, 2010, Pages 7316-7322

Preparation and characterization of patterned copper sulfide thin films on n-type TiO 2 film surfaces

(4) Lu, Yongjuan a,b Yi, Gewen a Jia, Junhong a Liang, Yongmin a

a LANZHOU INSTITUTE OF CHEMICAL PHYSICS (China)

b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

Author keywords

Characterization; Copper sulfide; Micropattern; Optical property; Thin film

Indexed keywords

CHARACTERIZATION; COMPOSITE FILMS; CRYSTALLITES; FILM PREPARATION; MAGNETIC SEMICONDUCTORS; NUCLEATION; OPTICAL PROPERTIES; SEMICONDUCTOR GROWTH; SOLUTIONS; SULFUR COMPOUNDS; THIN FILMS; TITANIUM DIOXIDE;

ABSORPTION INTENSITY; COPPER SULFIDES; MICRO PATTERN; NUCLEATION AND GROWTH; SELECTIVE NUCLEATION; SURFACE FUNCTIONAL; TIO2 SEMICONDUCTOR; WAVELENGTH DIFFERENCE;

COPPER COMPOUNDS;

EID: 77955309004 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2010.05.072 Document Type: Article

Times cited : (12)

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