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Volumn 494, Issue 4-6, 2010, Pages 279-283

IR and Raman spectroscopy study of YAG nanoceramics

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZE; FT-IR SPECTRUM; HIGH PRESSURE SINTERING; IR AND RAMAN SPECTROSCOPY; IR BANDS; IR TECHNIQUES; LOW TEMPERATURES; NANO CERAMICS; PARTIAL AMORPHIZATION; RAMAN SCATTERING INTENSITY; SINTERING PRESSURE; TEM; XRD; YAG;

EID: 77955305763     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2010.06.033     Document Type: Article
Times cited : (58)

References (41)
  • 10
    • 0002690488 scopus 로고
    • Crystal imperfection broadening and peak shape in the Rietveld method
    • R.A. Young (Ed.) Oxford Science, Oxford, United Kingdom
    • R. Delhez, T.H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, E.J. Sonneveld, Crystal imperfection broadening and peak shape in the Rietveld method, in: R.A. Young (Ed.), The Rietveld Method, Oxford Science, Oxford, United Kingdom, 1993, p. 132.
    • (1993) The Rietveld Method , pp. 132
    • R. Delhez1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.