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Volumn 42, Issue 1, 2010, Pages 21-23
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Hyphenation: The next step in thermal analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL INFORMATION;
GAS ANALYSIS;
HYPHENATED SYSTEMS;
INFRARED SPECTROMETRY;
MATERIAL BEHAVIOR;
SIMULTANEOUS ANALYSIS;
THERMAL ANALYSIS;
THERMAL TECHNIQUES;
UV LIGHT;
CHEMICAL CONTAMINATION;
DIFFERENTIAL SCANNING CALORIMETRY;
DRUG PRODUCTS;
DYNAMIC ANALYSIS;
DYNAMIC MECHANICAL ANALYSIS;
INFRARED SPECTROSCOPY;
LIGHT SOURCES;
THERMOGRAVIMETRIC ANALYSIS;
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EID: 77955293151
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (12)
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