Highly reliable flexible active optical links

IEEE Photonics Technology Letters

Volumn 22, Issue 5, 2010, Pages 287-289

  Bosnian, Erwin ^a   Van Steenberge, Geert ^a   Van Hoe, Bram ^a   Missinne, Jeroen ^a   Vanfleteren, Jan ^a   Van Daele, Peter ^a  

^a IMEC   (Belgium)

Author keywords

Embedding; Flexible; Optical interconnect; Optical waveguide; Reliability

Indexed keywords

ACCELERATED AGING TEST; BENDING RADIUS; CLADDING LAYER; EMBEDDED ACTIVE; EMBEDDED LAYERS; EMBEDDING; FLEXIBLE; FLEXIBLE WAVEGUIDES; LOW LOSS; MICRO MIRROR; OPTICAL INTERCONNECT; OPTICAL PROPAGATION LOSS; TEMPERATURE CYCLING; THIN FOIL; VERTICAL-CAVITY SURFACE EMITTING LASER;

ELECTRIC POWER SYSTEM INTERCONNECTION; INTEGRATED OPTICS; LASER CLADDING; LASERS; OPTICAL INTERCONNECTS; OPTICAL LINKS; OPTICAL WAVEGUIDES; RELIABILITY; SURFACE EMITTING LASERS; TESTING;

WAVEGUIDES;

EID: 77955220566     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2009.2038797     Document Type: Article

References (2)

1. J. Fjelstad, Flexible Circuit Technology, Third ed. Seaside, OR: BR Publishing, 2007.
2. G. Van Steenberge, P. Geerinck, S. Van Put, J. Van. Koetsem, H. Ottevaere, D. Morlion, H. Thienpont, and P. Van Daele, "MT-compatible laser-ablated interconnections for optical printed circuit boards," J. Lightw. Technol, vol. 22, no. 9, pp. 2083-2090, Sep. 2004.