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Volumn , Issue , 2010, Pages 373-378

Study of ERP test-suite reduction based on modified condition/decision coverage

Author keywords

Test cases; Test suite reduction algorithm

Indexed keywords

BIOBJECTIVE MODEL; COVERAGE DEGREE; ENTERPRISE RESOURCE PLANNING SYSTEMS; LESSONS LEARNED; MICROSOFT; MODIFIED CONDITION/DECISION COVERAGES; REGRESSION TESTING; RISK OF FAILURE; SOFTWARE MARKETS; TEST CASE; TEST COST; TEST EFFICIENCY; TEST REQUIREMENTS; TEST SUITE REDUCTION; VERIFICATION METHOD;

EID: 77955200722     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCRD.2010.77     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 2
    • 0037341612 scopus 로고    scopus 로고
    • Test-suite reduction and prioritization for modified condition/decision coverage
    • IEEE, March
    • J.A. Jones, and M.J. Harrold, "Test-suite reduction and prioritization for modified condition/decision coverage",IEEE Transactions on Software Engineering, IEEE, March 2003, pp. 195-209.
    • (2003) IEEE Transactions on Software Engineering , pp. 195-209
    • Jones, J.A.1    Harrold, M.J.2
  • 4
    • 2942562177 scopus 로고    scopus 로고
    • Optimizing testing efficiency with error-prone path identification and genetic algorithms
    • IEEE Computer Society, Melbourne, Vic.,Australia
    • J.R. Birt, R. Sitte, "Optimizing Testing Efficiency with Error-Prone Path Identification and Genetic Algorithms",Proceedings of the 2004 Australian Software Engineering Conference, IEEE Computer Society, Melbourne, Vic.,Australia, 2004, pp. 106-115.
    • (2004) Proceedings of the 2004 Australian Software Engineering Conference , pp. 106-115
    • Birt, J.R.1    Sitte, R.2
  • 5
    • 0032305987 scopus 로고    scopus 로고
    • An empirical study of the effects of minimization on the fault detection capabilities of test suites
    • IEEE Computer Society, Bethesda, MD, USA, November
    • G. Rothermel, M.J. Harrold, J. Ostrin, and C. Hong, "An empirical study of the effects of minimization on the fault detection capabilities of test suites", Proceedings of the 1998 IEEE International Conference on Software Maintenance, IEEE Computer Society, Bethesda, MD, USA, November 1998, pp. 34-43.
    • (1998) Proceedings of the 1998 IEEE International Conference on Software Maintenance , pp. 34-43
    • Rothermel, G.1    Harrold, M.J.2    Ostrin, J.3    Hong, C.4
  • 6
    • 0002158583 scopus 로고
    • Procedures for reducing the size of coverage-based test sets
    • Washington, DC, USA, June
    • J. Offutt, J. Pan, and J.M. Voas, "Procedures for reducing the size of coverage-based test sets", Proceedings of the 12th International Conference on Testing Computer Software, Washington, DC, USA, June 1995, pp. 111-123.
    • (1995) th International Conference on Testing Computer Software , pp. 111-123
    • Offutt, J.1    Pan, J.2    Voas, J.M.3
  • 7
    • 0035017874 scopus 로고    scopus 로고
    • Incorporating varying test costs and fault severities into test case prioritization
    • Institute of Electrical and Electronics Engineers Computer Society Toronto, Ontario Canada May
    • S. Elbaum, A. Malishevshy, and G. Rothermel,Incorporating varying test costs and fault severities into test case prioritization", Proceedings of the 23rd International Conference on Software Engineering, Institute of Electrical and Electronics Engineers Computer Society, Toronto,Ontario, Canada, May 2001, pp. 329-338.
    • (2001) Proceedings of the 23rd International Conference on Software Engineering , pp. 329-338
    • Elbaum, S.1    Malishevshy, A.2    Rothermel, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.