Local integral mean-based sifting for empirical mode decomposition

IEEE Signal Processing Letters

Volumn 16, Issue 10, 2009, Pages 841-844

  Hong, Hong ^a   Wang, Xinlong ^a   Tao, Zhiyong ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Accelerated iteration; EMD; Local integral mean (LIM); Mode mixing; Noise resistance; Sifting

Indexed keywords

ACCELERATED ITERATION; EMD; LOCAL INTEGRAL MEAN (LIM); MODE MIXING; NOISE RESISTANCE; SIFTING;

DECOMPOSITION;

EID: 77955178689     PISSN: 10709908     EISSN: None     Source Type: Journal    
DOI: 10.1109/LSP.2009.2025925     Document Type: Article

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