|
Volumn 502, Issue 2, 2010, Pages 341-345
|
Piezoelectric and dielectric properties of Sm2O 3-doped 0.82Bi0.5Na0.5TiO3-0. 18Bi0.5K0.5TiO3 ceramics
|
Author keywords
Ceramics; Electronic properties; Piezoelectricity; Solid state reaction; X ray diffraction
|
Indexed keywords
CERAMICS;
CONVENTIONAL MIXED OXIDES;
DIELECTRIC AND PIEZOELECTRIC PROPERTIES;
ELECTRICAL PROPERTY;
HIGH PIEZOELECTRIC CONSTANT;
LEAD-FREE;
OPTIMUM PROPERTIES;
PLANAR COUPLING FACTOR;
PURE PEROVSKITE STRUCTURE;
ROOM TEMPERATURE;
SEM IMAGE;
TIO;
CRYSTALLOGRAPHY;
DOPING (ADDITIVES);
ELECTRON ENERGY ANALYZERS;
ELECTRONIC PROPERTIES;
OXIDE MINERALS;
PEROVSKITE;
PIEZOELECTRIC CERAMICS;
PIEZOELECTRIC DEVICES;
PIEZOELECTRICITY;
SODIUM;
X RAY DIFFRACTION;
X RAYS;
ELECTRIC PROPERTIES;
|
EID: 77955171101
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.03.241 Document Type: Article |
Times cited : (47)
|
References (33)
|