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Volumn 44, Issue 11 PART 2, 2008, Pages 3913-3916
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Characterization of nanocrystalline permalloy thin films obtained by nitrogen IBAD
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Author keywords
Magnetization reversal; M ssbauer spectroscopy; Soft magnetic films
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Indexed keywords
COERCIVE FORCE;
CRYSTALLITE SIZE;
FERROMAGNETIC MATERIALS;
ION BEAMS;
IONS;
IRON ALLOYS;
IRON METALLOGRAPHY;
MAGNETIZATION REVERSAL;
MOLYBDENUM METALLOGRAPHY;
NANOCRYSTALS;
NICKEL ALLOYS;
NICKEL METALLOGRAPHY;
NITROGEN;
PARAMAGNETISM;
PERMALLOY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SPUTTERING;
THIN FILMS;
DUAL ION BEAM SPUTTERING;
KERR MAGNETOMETRY;
MAGNETIZATION REVERSAL MECHANISMS;
NANO-CRYSTALLINE STRUCTURES;
NITROGEN ION BEAM;
PERMALLOY THIN FILMS;
SOFT MAGNETIC FILMS;
SSBAUER SPECTROSCOPIES;
ION BEAM ASSISTED DEPOSITION;
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EID: 77955157363
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/TMAG.2008.2002483 Document Type: Article |
Times cited : (11)
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References (15)
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