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Applied Physics Letters

Volumn 97, Issue 2, 2010, Pages

Demonstration of edge roughness effect on the magnetization reversal of spin valve submicron wires

(7) Chiang, T W a,b Chang, L J a,c Yu, C a Huang, S Y a Chen, D C a Yao, Y D d Lee, S F a

a INSTITUTE OF PHYSICS (Taiwan)

b NATIONAL TAIWAN UNIVERSITY (Taiwan)

c NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

d FU JEN CATHOLIC UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL ROUGHNESS; AVERAGE VELOCITY; CURRENT INDUCED DOMAINS; DOMAIN WALL VELOCITIES; EDGE ROUGHNESS; IN-PLANE; LOCAL MAGNETIZATION; SPIN VALVE; SUB-MICRON WIRES; SUBMICRON; TRANSVERSE MAGNETIC FIELD; TRILAYERS;

MAGNETIC DOMAINS; MAGNETIC FIELDS; SPIN DYNAMICS; WIRE;

MAGNETIZATION REVERSAL;

EID: 77955139044 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3463459 Document Type: Article

Times cited : (12)

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