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Volumn 105, Issue 5, 2010, Pages

Steplike intensity threshold behavior of extreme ionization in laser-driven xenon clusters

(10) Doppner T a,c Muller J P a Przystawik, A a Gode S a Tiggesbaumker J a Meiwes Broer, K H a Varin, C b Ramunno, L b Brabec, T b Fennel, T a,b

a UNIVERSITY OF ROSTOCK (Germany)

b UNIVERSITY OF OTTAWA (Canada)

c LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM NANODROPLETS; HIGHLY CHARGED ION PRODUCTION; INTENSE FEMTOSECOND LASER PULSE; INTENSITY THRESHOLD; ION CHARGE; ION GENERATION; IONIZATION PROCESS; LASER INTENSITIES; LOW THRESHOLDS;

HELIUM; IONIZATION OF LIQUIDS; IONS; LASER BEAM WELDING; MOLECULAR DYNAMICS; PARTICLE DETECTORS; ULTRASHORT PULSES; XENON;

PULSED LASER APPLICATIONS;

EID: 77955138897 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.105.053401 Document Type: Article

Times cited : (47)

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