Contact mode scanning Hall probe microscopy

IEEE Transactions on Magnetics

Volumn 44, Issue 11 PART 1, 2008, Pages 3252-3254

  Ohashi, Toru ^a   Osawa, Hirotaka ^a   Sandhu, Adarsh ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Ferromagnetic materials; Hall sensors; Magnetic domains; Scanning hall probe microscopy (SHPM)

Indexed keywords

EID: 77955103951     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2001621     Document Type: Article

References (9)

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