Analysis and processing of CCD noise

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

Volumn 33, Issue 4, 2004, Pages

  Xu, Xiu Zhen ^a   Li, Zi Tian ^a   Xue, Li Jun ^a  

^a XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

Author keywords

CCD; Correlated Double Sampling (CDS); Dark current noise; Readout noise

Indexed keywords

CORRELATED DOUBLE SAMPLING (CDS); DARK CURRENT NOISE; DUAL SLOPE INTEGRATION; READOUT NOISE;

IMAGE ANALYSIS; INTEGRATION; OPTICAL CORRELATION; SAMPLING; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

CHARGE COUPLED DEVICES;

EID: 77955096362     PISSN: 10072276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. Kriss Michael, Parulski Ken, David Lewis. Critical technologies for still imaging systems[A]. SPIE[C]. 1989, 1082, 157-183.
2. Jim Janesick, Tom Ellion. Sandbox CCDs[A]. SPIE[C]. 1995, 2415. 2-41.