Bayesian change-point analysis for atomic force microscopy and soft material indentation

Journal of the Royal Statistical Society. Series C: Applied Statistics

Volumn 59, Issue 4, 2010, Pages 573-593

  Rudoy, Daniel ^a   Yuen, Shelten G ^a   Howe, Robert D ^a   Wolfe, Patrick J ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

Change point detection; Constrained switching regressions; Hierarchical Bayesian models; Indentation testing; Markov chain Monte Carlo methods; Materials science; Young's modulus

Indexed keywords

EID: 77955080573     PISSN: 00359254     EISSN: 14679876     Source Type: Journal    
DOI: 10.1111/j.1467-9876.2010.00715.x     Document Type: Article

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