Enhanced electric field sensitivity of rf-dressed Rydberg dark states

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Bason, M G ^a   Tanasittikosol, M ^a   Sargsyan, A ^b   Mohapatra, A K ^c   Sarkisyan, D ^b   Potvliege, R M ^a   Adams, C S ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

^b INSTITUTE FOR PHYSICAL RESEARCH   (Armenia)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

A-THERMAL; CONFINED GEOMETRIES; CONTINUOUS MEASUREMENTS; DARK STATE; DC ELECTRIC FIELD; DC FIELD; ELECTROMAGNETICALLY-INDUCED TRANSPARENCY; ENHANCED SENSITIVITY; INHOMOGENEITIES; INTERACTION REGION; LASER FREQUENCY; OPTICAL DETECTION; PRECISE MEASUREMENTS; RADIO FREQUENCIES; RYDBERG; SPACE CHARGES;

DIAGNOSTIC RADIOGRAPHY; ELECTRIC FIELDS; ELECTRIC IMPEDANCE TOMOGRAPHY; QUANTUM OPTICS; RUBIDIUM;

ELECTRIC FIELD MEASUREMENT;

EID: 77955069643     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/6/065015     Document Type: Article

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