Simple tools for characterization of synchrotron beam flux, energy resolution and stability

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 645-648

  Dvorak, Joseph ^a   Berman, Lonny ^a   Hulbert, Steven L ^a   Peter Siddons, D ^a   Wallwork, Kia ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

energy resolution; synchrotron beamline characterization; synchrotron radiation

Indexed keywords

EID: 77955040341     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463289     Document Type: Conference Paper

References (4)

1. R. Korde, J. Sprunck, K. Medjoubi, S. Hustache, J. Seely, "Silicon Absolute X-ray Detectors", submitted for publication.
2. F. Scholze, H. Hennedken, P. Kuschnerus, H. Rabus, M. Richter and G. Ulm, "Determination of the electron-hole pair creation energy for semiconductors from the spectral responsivity of photodiodes", Nucl. Instr. and Meth. in Phys. Res. A, 439 (2000) 208.
3. Center for X-ray Optics, LBL, http://www-cxro.lbl.gov/optical-constants/.
4. For example, the Beamline Evaluation Group at the APS developed a series of tests to evaluate the performance of spectroscopy beamlines. For energy resolution, they scan the pre-edge feature of vanadium pentoxide at 5469 eV. See http://xafs.org/APSXAFS/APS-XOR-Eval.