Preliminary commissioning and performance of the soft x-ray micro-characterization beamline at the Canadian light source

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 343-346

  Hu, Y F ^a   Coulthard, I ^a   Chevrier, D ^a   Wright, G ^a   Igarashi, R ^a   Sitnikov, A ^a   Yates, B W ^a   Hallin, E L ^a   Sham, T K ^b   Reininger, R ^c  

^a CANADIAN LIGHT SOURCE INC   (Canada)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

^c Scientific Answers and Solutions   (United States)

Author keywords

DCM; InSb(111); medium energy beamline; microprobe; Si(111); XAFS

Indexed keywords

EID: 77955039503     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463208     Document Type: Conference Paper

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