Metrology and tests beamline at SOLEIL design and first results

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 485-488

  Idir, Mourad ^a   Mercere, Pascal ^a   Moreno, Thierry ^a   Delmotte, Aurélien ^a   Dasilva, Paulo ^a   Modi, Mohammed H ^a,b  

^a SYNCHROTRON SOLEIL   (France)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

calibration; Metrology beamline; test beamline; x ray optics

Indexed keywords

EID: 77955039317     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463247     Document Type: Conference Paper

References (2)

1. G. Ulm, "Radiometry with synchrotron radiation". Metrologia 40 (2003) S101-S106
2. M.C. Hettrick and J.H. Underwood, in Short Wavelength Coherent Radiation: Generation and Applications, edited by D.T. Attwood and J. Bokor, (AIP Conf. Proc. 147, 1986) p. 237; US Patent No. 4,776,696 (1988).