Thermal annealing and electrochemical purification of multi-walled carbon nanotubes produced by camphor/ferrocene mixtures

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 2, 2010, Pages 1296-1303

  Antunes, E F ^a,b   Almeida, E C ^a   Rosa, C B F ^a   L I De Medeiros, ^a   Pardini, L C ^c   Massi, M ^b   Corat, E J ^a  

^a Instituto National de Pesquisas Espacials   (Brazil)

^b Lnstituto Tecnoldgico de AeronMica   (Brazil)

^c Lnstituto de Aeronáuitica e Espaço   (Brazil)

Author keywords

Camphor; Electrochemical purification; Ferrocene; Mwcnt; Thermal annealing

Indexed keywords

CARBON FELTS; CRYSTALLINE STRUCTURE; ELECTROCHEMICAL TREATMENTS; FERROCENE; FERROCENES; INTERNAL STRUCTURE; IRON REMOVAL; METRIC ANALYSIS; THERMAL-ANNEALING;

ANNEALING; CARBON NANOTUBES; IRON COMPOUNDS; MULTIWALLED CARBON NANOTUBES (MWCN); OXIDE MINERALS; PURIFICATION; QUARTZ; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

METAL ANALYSIS;

EID: 77955004544     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.1830     Document Type: Conference Paper

References (30)

1. J. N. Coleman, W. J. Blau, and Y. K. Gun'ko, Carbon 44, 1624 (2006).
2. P. Avouris, Z. H. Chen, and V. Perebeinos, Nat. Nanotechnol. 2, 605 (2007).
3. J. C. Charlier, X. Blase, and S. Roche, Rev. Modern Phys. 79, 677 (2007).
4. M. Terrones, Int. Mater. Rev. 49, 325 (2004).
5. M. S. Dresselhaus and P. C. Eklund, Adv. Phys. 49, 705 (2000).
6. H. Terrones, F. López-Urías, E. Muñoz-Sandoval, J. A. Rodríguez- Manzo, A. Zamudio, A. L. Elias, and M. Terrones, Solid State Sci. 8, 303 (2006).
7. C. Goze-Latil, P. Lauginie, V. Jourdain, J. Conard, L. Duclaux, A. Rubio, and P. Bemier, Carbon 40, 1825 (2002).
8. C. Oncel and Y. Yurum, Fullerenes, Nanotubes, and Carbon Nanostructures 14, 17 (2006).
9. K. Hernadi, A. Fonseca, J. B. Nagy, A. Siska, and I. Kiricsi, Applied Catalysis A: General 199, 245 (2000).
10. H. Dai, A. G. Rinzler, P. Nikolaev, A. Thess, D. T. Colbert, and R. E. Smalley, Chem. Phys. Lett. 26, 471 (1996).
11. C. H. See and A. T. Harris, Ind. Eng. Chem. Res. 46, 997 (2007).
12. D. J. Suh, T. J. Park, J. H. Kim, and K. L. Kim, Chem. Mater. 9, 1903 (1997).
13. V. Ivanov, J. B. Nagy, Ph. Lambin, A. Lucas, X. B. Zhang, X. F. Zhang, D. Bernaerts, G. van Tendeloo, S. Amelinckx, and J. van Landuyt, Chem. Phys. Lett. 223, 329 (1994).
14. C. Xu and J. Zhu, Nanotechnology 11, 1671 (2004).
15. J. A. Schwarz, C. Contescu, and A. Contescu, Chem. Rev. 95, 477 (1995).
16. M. Kumar and Y. Ando, Diam. Rel. Mat. 12, 998 (2003).
17. M. Kumar and Y. Ando, Carbon 43, 533 (2005).
18. M. Kumar, T. Okazaki, M. Hiramatsu, and Y. Ando, Carbon 45, 1899 (2007).
19. S. Musso, S. Porro, M. Rovere, A. Chiodoni, and A. Tagliaferro, Diam. Rel. Mater. 16, 1174 (2007).
20. W. Huang, Y. Wang, G. Luo, and F. Wei, Carbon 41, 2585 (2003).
21. J. Chen, J. Y. Shan, T. Tsukada, F. Munekane, A. Kuno, M. Matsuo, T. Hayashi, Y. A. Kim, and M. Endo, Carbon 45, 274 (2007).
22. H. T. Fang, C. G. Liu, C. Liu, F. Li, and H. M. Cheng, Chem. Mater. 16, 5744 (2004).
23. G. Capote, L. F. Bonetti, V. J. Trava-Airoldi, L. V. Santos, and E. J. Corat, Brazilian Journal of Vacuum Applications 25, 209 (2006).
24. M. S. Dresselhaus, G. Dresselhaus, R. Saito, and A. Jorio, Phys. Rep. 409, 47 (2005).
25. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 97, 187401 (2006).
26. E. F. Antunes, A. O. Lobo, E. J. Corat, V. J. Trava-Airoldi, A. A. Martin, and C. Verfssimo, Carbon 44, 2202 (2006).
27. M. A. Pimenta, G. Dresselhaus, M. S. Dresselhaus, L. G. Cancado, A. Jorio, and R. Saito, Phys. Chem. Chem. Phys. 9, 1276 (2007).
28. S. Musso, M. Giorcelli, M. Pavese, S. Bianco, M. Rovere, and A. Tagliaferro, Diam. Rel. Mater. 17, 542 (2008).
29. J. Chen, A. Kuno, M. Matsuo, T. Tsukada, T. Tamura, K. Osato, J. Y. Shan, F. Munekane, Y. A. Kim, T. Hayashi, and M. Endo, Carbon 46, 391 (2008).
30. A. J. Bard and L. R. Faulkner. Electrochemical Methods: Fundamentals and Applications, John Wiley & Sons, New York (2001).