Design of Experiments on an EMC test chip for the interrogation of SI and EMC measures

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2003, Pages 844-847

  Coenen, Mart ^a   Derikx, Richard ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Box Behnken; Design of Experiments; EMC test chip; Ground bounce; RF emission; Signal integrity; Statistics; Substrate gradient noise

Indexed keywords

DESIGN OF EXPERIMENTS; ELECTRIC POWER TRANSMISSION NETWORKS; STATISTICS; SUBSTRATES; TESTING;

BOX-BEHNKEN; EMC TEST; GRADIENT NOISE; GROUND BOUNCE; SIGNAL INTEGRITY;

ELECTROMAGNETIC COMPATIBILITY;

EID: 77954997377     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ICSMC2.2003.1429039     Document Type: Conference Paper

References (6)

1. Statistics for Experimenters, George Box, William Hunter, J. Stuart Hunter, John Wiley and Sons Inc. 1978.
2. Quality Engineering using Robust Design, Madhav Padke, Prentice Hall, 1989.
3. Design of Experiments, Course Syllabus CQM, April 2002
4. Design of Experiments, "Van probleem tot oplossing", Philips Semiconductors, 1E&S, March 1998, RNR-E88-98/023
5. C075 EMC test-chip Implementation report, Harm Peters, Philips Semiconductors, TCG Microtel, February 9, 2000
6. Analyse Experimenten EMC Testchip, Ing R.J.A.M. van Lieshout, drs. M. Swaving, Projectrapport nr.: E1753-01