Microstructural properties at the interfaces of zno nanorods and ZNO homo-buffer layers

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 2, 2010, Pages 912-918

  Kwak, Changha ^a   Kim, Byung Hyuk ^b   Park, Chang Ln ^b   Park, Sun Hong ^c   Seo, Soo Young ^a   Kim, Seon Hyo ^a   Han, Sang Wook ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Chonbuk National University   (South Korea)

^c Research Institute of Industrial Science and Technology (RIST)   (South Korea)

Author keywords

Epitaxial growth; Homo buffer; MOCVD; Nanorod; Structure; ZnO

Indexed keywords

CATALYST-FREE; CHEMICAL VAPOR PROCESS; EX SITU; FILM SURFACES; GROWTH DIRECTIONS; HOMO-BUFFER; HOMO-BUFFER LAYERS; IN-SITU; MICROSTRUCTURAL PROPERTIES; MOCVD; STRUCTURAL DISORDERS; WELL-ALIGNED; ZNO; ZNO FILMS; ZNO NANOROD;

BUFFER LAYERS; EPITAXIAL GROWTH; FILM GROWTH; METALLIC FILMS; NANORODS; ORGANIC CHEMICALS; SINGLE CRYSTALS; SURFACE PROPERTIES; SURFACE ROUGHNESS;

ZINC OXIDE;

EID: 77954996130     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.1895     Document Type: Conference Paper

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