Optimization of sintering temperature in CdZnS films using reflection spectroscopy

Journal of Coatings Technology and Research

Volumn 7, Issue 3, 2010, Pages 399-402

  Kumar, Vipin ^a   Juneja, Soniya ^a   Sharma, Sachin K ^b   Singh, V ^c   Sharma, T P ^d  

^a KRISHNA INSTITUTE OF ENGINEERING AND TECHNOLOGY   (India)

^b DAV College Muzaffarnagar   (India)

^c SG PG College   (India)

^d UNIVERSITY OF RAJASTHAN   (India)

Author keywords

Band gap; Reflection spec; Semiconductors; Sintering; Thin films; X ray diffraction

Indexed keywords

ATMOSPHERIC TEMPERATURE; CADMIUM CHLORIDE; CADMIUM SULFIDE; CHLORINE COMPOUNDS; ELECTROMAGNETIC WAVE REFLECTION; ENERGY GAP; ETHYLENE; ETHYLENE GLYCOL; II-VI SEMICONDUCTORS; SEMICONDUCTOR MATERIALS; SINTERING; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION; ZINC SULFIDE;

AIR ATMOSPHERE; GLASS SUBSTRATES; POLYCRYSTALLINE FILM; REFLECTION SPECTROSCOPY; SINTERING TEMPERATURES; SINTERING TIME; SPECTROSCOPIC STUDIES;

SULFUR COMPOUNDS;

EID: 77954953633     PISSN: 15470091     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11998-009-9224-y     Document Type: Article

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