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Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 10, 2010, Pages

Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry

(14) Olejnik, K a,b Wadley, P c Haigh, J A c Edmonds, K W c Campion, R P c Rushforth, A W c Gallagher, B L c Foxon, C T c Jungwirth, T b,c Wunderlich, J a,b Dhesi, S S d Cavill, S A d Van Der Laan, G d Arenholz, E e

a HITACHI CAMBRIDGE LABORATORY (United Kingdom)

b INSTITUTE OF PHYSICS (Czech Republic)

c UNIVERSITY OF NOTTINGHAM (United Kingdom)

d DIAMOND LIGHT SOURCE LTD (United Kingdom)

e LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954943916 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.81.104402 Document Type: Article

Times cited : (28)

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