Extended depth-of-focus by digital holographic microscopy

Optics Letters

Volumn 35, Issue 11, 2010, Pages 1840-1842

  Colomb, Tristan ^a   Pavillon, Nicolas ^b   Kühn, Jonas ^b   Cuche, Etienne ^a   Depeursinge, Christian ^b   Emery, Yves ^a  

^a Lyncee Tec SA   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX DATA; DEPTH OF FOCUS; DIGITAL HOLOGRAPHIC MICROSCOPY; EXTENDED DEPTH OF FOCUS; FINITE DEPTH; METROLOGICAL APPLICATIONS; MICRO-LENS; MICROSCOPE OBJECTIVE; REFLECTION AND TRANSMISSION; RETRO REFLECTOR; UNIQUE FEATURES;

AMPLITUDE MODULATION; HOLOGRAMS; LIGHT POLARIZATION; MICROLENSES; PHASE MEASUREMENT; TOPOGRAPHY;

PHOTOLITHOGRAPHY;

EID: 77954921938     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.001840     Document Type: Article

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