Excitonic interactions with intense terahertz pulses in ZnSe/ZnMgSSe multiple quantum wells

Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 8, 2010, Pages

  Hirori, Hideki ^a,b   Nagai, Masaya ^c   Tanaka, Koichiro ^a,b,c  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954866978     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.081305     Document Type: Article

References (35)

1. S. H. Autler and C. H. Townes, Phys. Rev. 100, 703 (1955). 10.1103/PhysRev.100.703
2. A. Mysyrowicz, D. Hulin, A. Antonetti, A. Migus, W. T. Masselink, and H. Morkoç, Phys. Rev. Lett. 56, 2748 (1986). 10.1103/PhysRevLett.56.2748
3. I. I. Rabi, Phys. Rev. 51, 652 (1937). 10.1103/PhysRev.51.652
4. S. G. Carter, V. Birkedal, C. S. Wang, L. A. Coldren, A. V. Maslov, D. S. Citrin, and M. S. Sherwin, Science 310, 651 (2005). 10.1126/science.1116195
5. S. E. Harris, J. E. Field, and A. Imamoglu, Phys. Rev. Lett. 64, 1107 (1990). 10.1103/PhysRevLett.64.1107
6. P. B. Corkum, N. H. Burnett, and F. Brunel, Phys. Rev. Lett. 62, 1259 (1989). 10.1103/PhysRevLett.62.1259
7. M. Y. Ivanov and P. B. Corkum, Phys. Rev. A 48, 580 (1993). 10.1103/PhysRevA.48.580
8. T. Brabec and F. Krausz, Rev. Mod. Phys. 72, 545 (2000). 10.1103/RevModPhys.72.545
9. C. W. Luo, K. Reimann, M. Woerner, T. Elsaesser, R. Hey, and K. H. Ploog, Phys. Rev. Lett. 92, 047402 (2004). 10.1103/PhysRevLett.92.047402
10. J. R. Danielson, Y.-S. Lee, J. P. Prineas, J. T. Steiner, M. Kira, and S. W. Koch, Phys. Rev. Lett. 99, 237401 (2007). 10.1103/PhysRevLett.99.237401
11. S. Leinß, T. Kampfrath, K. v. Volkmann, M. Wolf, J. T. Steiner, M. Kira, S. W. Koch, A. Leitenstorfer, and R. Huber, Phys. Rev. Lett. 101, 246401 (2008). 10.1103/PhysRevLett.101.246401
12. L. Razzari, F. H. Su, G. Sharma, F. Blanchard, A. Ayesheshim, H.-C. Bandulet, R. Morandotti, J.-C. Kieffer, T. Ozaki, M. Reid, and F. A. Hegmann, Phys. Rev. B 79, 193204 (2009). 10.1103/PhysRevB.79.193204
13. M. C. Hoffmann, J. Hebling, H. Y. Hwang, K. -L. Yeh, and K. A. Nelson, Phys. Rev. B 79, 161201 (R) (2009). 10.1103/PhysRevB.79.161201
14. A. H. Chin, J. M. Bakker, and J. Kono, Phys. Rev. Lett. 85, 3293 (2000). 10.1103/PhysRevLett.85.3293
15. K. B. Nordstrom, K. Johnsen, S. J. Allen, A.-P. Jauho, B. Birnir, J. Kono, T. Noda, H. Akiyama, and H. Sakaki, Phys. Rev. Lett. 81, 457 (1998). 10.1103/PhysRevLett.81.457
16. A. Srivastava, R. Srivastava, J. Wang, and J. Kono, Phys. Rev. Lett. 93, 157401 (2004). 10.1103/PhysRevLett.93.157401
17. T. Ogawa, in Optical Properties of Low-Dimensional Materials, edited by, T. Ogawa, and, Y. Kanemitsu, (World Scientific, Singapore, 1995).
18. C. F. Klingshirm, Semiconductor Optics (Springer, Berlin, 1997).
19. J. Hebling, G. Almási, and J. Kuhl, Opt. Express 10, 1161 (2002).
20. J. Hebling, A. G. Stepanov, G. Almási, B. Bartal, and J. Kuhl, Appl. Phys. B: Lasers Opt. 78, 593 (2004). 10.1007/s00340-004-1469-7
21. M. Jewariya, M. Nagai, and K. Tanaka, J. Opt. Soc. Am. B 26, A101 (2009). 10.1364/JOSAB.26.00A101
22. An EO signal Δ I / I measured by balanced photodetectors is calibrated to electric-field amplitude E THz (Ref.). For the GaP detection crystal used here, the refractive index n opt = 3.2 [see Handbook of Optical Constants of Solids, edited by, E. D. Palik, (Academic Press, London, 1985)]
23. the EO coefficient r 41 = 1 pm / V [see Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 70, 1784 (1997)] and the thickness L = 300 μ m. 10.1063/1.118691
24. D. S. Chemla, D. A. B. Miller, P. W. Smith, A. C. Gossard, and W. Wiegmann, IEEE J. Quantum Electron. 20, 265 (1984). 10.1109/JQE.1984.1072393
25. The Sommerfield factor in the case of two-dimensional density of states is described by F (H Ω=2/{1+exp[-π(/H Ωc-HΩ|/R y)-1/2]}(see Ref.).
26. H. E. Gumlich, D. Theis, and D. Tschierse, in Physics of II-VI and I-VII Compounds, Landolt-Börnstein, edited by, O. Madelung, (Springer, Berlin, 1987).
27. c of the continuum and B of the background contribution, are 0.16, 2.879 eV, and 0.14, respectively. Upon increasing E THz from 0 to 68 kV/cm, α hh and α lh decrease from 0.84 to 0.36 and from 0.34 to 0.24, respectively.
28. D. F. Blossey, Phys. Rev. B 3, 1382 (1971). 10.1103/PhysRevB.3.1382
29. F. L. Lederman and J. D. Dow, Phys. Rev. B 13, 1633 (1976). 10.1103/PhysRevB.13.1633
30. Fresnel transmission coefficient at the boundary between the sample and air is described by t t∼= 2 / (√ ε 0 + 1), where ε 0 = 8.8 is used as a dielect ric constant of the sample (Ref.).
31. -=0.16 m 0 of ZnSe crystal (Ref.), and ω / 2 π of 1 THz.
32. D. A. B. Miller, D. S. Chemla, T. C. Damen, A. C. Gossard, W. Wiegmann, T. H. Wood, and C. A. Burrus, Phys. Rev. B 32, 1043 (1985). 10.1103/PhysRevB.32. 1043
33. J. Frenkel, Phys. Rev. 54, 647 (1938). 10.1103/PhysRev.54.647
34. S. Schmitt-Rink, D. S. Chemla, W. H. Knox, and D. A. B. Miller, Opt. Lett. 15, 60 (1990). 10.1364/OL.15.000060
35. S. Hataoka, A. Itoh, I. Tanahashi, and K. Tanaka, J. Lumin. 87-89, 853 (2000). 10.1016/S0022-2313(99)00440-8