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Volumn 81, Issue 4, 2010, Pages

Skyrmion lattice in the doped semiconductor Fe1-xCo xSi

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EID: 77954824169     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.041203     Document Type: Article
Times cited : (771)

References (31)
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    • I. Klebanov, Nucl. Phys. B 262, 133 (1985). 10.1016/0550-3213(85)90068-9
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    • Klebanov, I.1
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    • 0346376603 scopus 로고
    • 10.1088/0022-3719/13/31/002
    • P. Båk and M. H. Jensen, J. Phys. C 13, L881 (1980). 10.1088/0022-3719/13/31/002
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    • Båk, P.1    Jensen, M.H.2
  • 25
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    • note
    • To obtain the data shown in Figs. the sample was rotated with respect to the vertical axis by fixed angles. The intensity maxima for 〈110〉 are the only way to explain the intensity patterns shown in Figs. consistently. This confirms the sample orientation independently.
  • 26
    • 77954825400 scopus 로고    scopus 로고
    • For x=0.25 the intensity of the maxima for the various 〈110〉 directions is not exactly identical.
    • For x = 0.25 the intensity of the maxima for the various 〈110〉 directions is not exactly identical.
  • 31
    • 38349187952 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.77.024415
    • I. Fischer, N. Shah, and A. Rosch, Phys. Rev. B 77, 024415 (2008). 10.1103/PhysRevB.77.024415
    • (2008) Phys. Rev. B , vol.77 , pp. 024415
    • Fischer, I.1    Shah, N.2    Rosch, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.