SCOPUS 정보 검색 플랫폼

Volumn 651, Issue , 2010, Pages 1-9

Advanced input files & parametric quantitative analysis using topas

Author keywords

jEdit; Powder diffraction; Quantitative analysis; Rietveld refinement

Indexed keywords

CHEMICAL ANALYSIS; DIFFRACTION; TUNGSTEN COMPOUNDS;

INPUT FILES; JEDIT; PARAMETRIC REFINEMENTS; POWDER DIFFRACTION; SOFTWARE SUITE;

RIETVELD REFINEMENT;

EID: 77954794205 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.651.1 Document Type: Conference Paper

Times cited : (85)

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