Study of inner-shell excitation and relaxation processes in atomic and ionic neon by means of soft X-ray spectroscopy

Plasma Science and Technology

Volumn 12, Issue 3, 2010, Pages 353-360

  Oura, M ^a  

^a RIKEN SPring 8 Center   (Japan)

Author keywords

merged beam method; multi configuration Dirac Fock (MCDF) calculation; neon; photoexcitation; soft X ray emission spectroscopy

Indexed keywords

AUGER DECAYS; BEAM METHODS; DOUBLY EXCITED STATE; ENERGY LEVEL; HOLE STATE; INNER SHELL EXCITATION; MULTI-CONFIGURATION DIRAC-FOCK (MCDF) CALCULATION; MULTICONFIGURATION DIRAC-FOCK; MULTICONFIGURATION DIRAC-FOCK METHOD; NEUTRAL NEONS; PHOTOION YIELD SPECTROSCOPY; PHOTOION YIELDS; RESONANT EXCITATION; RESONANT X-RAY EMISSION SPECTROSCOPIES; SOFT X RAY EMISSION SPECTROSCOPY; SOFT X-RAY; SPECTROSCOPIC INFORMATION; THEORETICAL CALCULATIONS;

ATOMS; ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC STATES; EMISSION SPECTROSCOPY; EXCITED STATES; ION BEAMS; NEON; PHOTOEXCITATION; RELAXATION PROCESSES; STRONTIUM COMPOUNDS; TARGETS; X RAY SCATTERING; X RAY SPECTROSCOPY; X RAYS;

ATOMIC SPECTROSCOPY;

EID: 77954763718     PISSN: 10090630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1009-0630/12/3/21     Document Type: Article

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