Automatic location of facial feature points and synthesis of facial sketches using direct combined model

IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics

Volumn 40, Issue 4, 2010, Pages 1158-1169

  Tu, Ching Ting ^a   Lien, Jenn Jier James ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Active appearance models; eigenface; face sketch synthesis; image processing and computer vision; statistical image models

Indexed keywords

ACTIVE APPEARANCE MODELS; AUTOMATIC LOCATION; COMBINED MODEL; EIGENFACES; FACIAL EXPRESSIONS; FACIAL FEATURE POINTS; FACIAL IMAGES; FACIAL SHAPE; FEATURE POINT; GAZE DIRECTION; HIGHLY SENSITIVE; IMAGE PROCESSING AND COMPUTER VISION; INPUT IMAGE; LIGHTING CONDITIONS; LIGHTING EFFECTS; MULTIPLE FEATURES; STATISTICAL IMAGE MODELS; SYSTEM-BASED; TEXTURE INFORMATION; TRAINING DATA SETS;

COMPUTER VISION; FEATURE EXTRACTION; IMAGE QUALITY; IMAGING SYSTEMS; LIGHTING; LOCATION; TEXTURES;

FACE RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER GRAPHICS; FACE; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; COMPUTER GRAPHICS; FACE; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 77954758938     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCB.2009.2035154     Document Type: Article

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