Intrinsic granularity in nanocrystalline boron-doped diamond films measured by scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 22, 2009, Pages

  Willems, B L ^a,b   Dao , V H ^a   Vanacken, J ^a   Chibotaru, L F ^a   Moshchalkov, V V ^a   Guillamon I ^c   Suderow, H ^c   Vieira, S ^c   Janssens, S D ^d   Williams, O A ^d,e   Haenen, K ^d,e   Wagner, P ^d,e  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNIVERSIDAD NACIONAL MAYOR DE SAN MARCOS   (Peru)

^c INSTITUTO NICOLÁS CABRERA   (Spain)

^d HASSELT UNIVERSITY   (Belgium)

^e IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954695637     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.224518     Document Type: Article

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45. -1. For simplicity, the estimation of H o r b has been done by using the free-electron approximation for the k space of the boron-doped diamond.