Deformation twinning in Ti-6Al-4V during low strain rate deformation to moderate strains at room temperature

Materials Science and Engineering: A

Volumn 527, Issue 21-22, 2010, Pages 5734-5744

  Prakash, D G Leo ^a   Ding, R ^b   Moat, R J ^a   Jones, I ^b   Withers, P J ^a   Fonseca, J Quinta da ^a   Preuss, M ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Deformation texture; Electron backscattering diffraction (EBSD); Titanium alloys; Transmission electron microscopy (TEM); Twinning

Indexed keywords

ALUMINUM ALLOYS; BACKSCATTERING; DEFORMATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; STRAIN RATE; TERNARY ALLOYS; TWINNING; VANADIUM ALLOYS;

BACKSCATTERING DIFFRACTION; BASAL TEXTURES; DEFORMATION TEXTURE; DEFORMATION TWINNING; ELECTRON BACKSCATTERING; ELECTRON BACKSCATTERING DIFFRACTION; ROLLING DIRECTION; TEXTURE COMPONENTS; TITANIUM (ALLOYS); TRANSMISSION ELECTRON MICROSCOPY;

TITANIUM ALLOYS;

EID: 77954676486     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2010.05.039     Document Type: Article

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