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Volumn 247, Issue 7, 2010, Pages 1637-1640

Interfacial structure of semipolar AlN grown on m-plane sapphire by MBE

Author keywords

High resolution transmission electron microscopy; III N semiconductors; Interface structure; Nitridation; Semipolar

Indexed keywords


EID: 77954607286     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200983675     Document Type: Article
Times cited : (14)

References (19)
  • 13
    • 77954618375 scopus 로고    scopus 로고
    • edited by P. Ruterana, M. Albrecht, and J. Neugebauer (Wiley- VCH, Weinheim), chap. 3
    • A. Georgakilas, H. M. Ng, and Ph. Komninou, in: Nitride Semiconductors: Handbook on Materials and Devices, edited by P. Ruterana, M. Albrecht, and J. Neugebauer (Wiley- VCH, Weinheim, 2003), chap. 3.
    • (2003) Handbook on Materials and Devices
    • Georgakilas, A.1    Ng, H.M.2    Komninou, Ph.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.